 新闻中心产品分类 |
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KLA|2139|KLA-TENCOR|2139
'- Wafer defect inspection system- 200mm capable- Standard Autoloader- Image Computer / Control Terminal- 400 MPS Image
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2015-03-20 |
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供应tencor|6420
KLA-TENCOR SURFSCAN 6420 DEFECT INSPECTION SYSTEM consisting of:- Model: Surfscan 6420- Bare wafer surface defect inspec
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2014-12-23 |
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泰克370A晶体管图示仪
Tests 2, 3, and 4 terminal semiconductors up to 220 W and 2,000 VDigital storage with on-screen readoutAutomatic test se
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2014-11-28 |
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泰克370A泰克370A晶体管图示仪
Tests 2, 3, and 4 terminal semiconductors up to 220 W and 2,000 VDigital storage with on-screen readoutAutomatic test se
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2014-11-14 |
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